Abstract:Aiming to address the problems of low efficiency and inconsistent standards in traditional manual inspection of wheat grain appearance quality,as well as the limitations of existing detection equipment such as single functionality,complex operation,and high cost,an automatic identification method for imperfect wheat grains and an accurate acquisition method for multiple phenotypic parameters of grains were proposed. The structure,workflow,and control scheme of a wheat grain appearance quality detection device were designed. A dataset containing six types of wheat samples (normal grains and five types of imperfect grains) was constructed. By replacing the backbone network and convolution modules,an identification method for imperfect wheat grains based on a lightweight deep learning network was proposed,with both precision and recall exceeding 95% on most classification datasets. Distortion correction was applied to grain images to eliminate the influence of distortion on aspect ratio measurement. Edge detection and watershed algorithms were used to segment grain contours,and an image-processing-based model for acquiring multiple phenotypic parameters of wheat grains was established. The root mean square errors of grain length,grain width,and aspect ratio were 0.19 mm,0.14 mm,and 0.10,respectively. Finally,a prototype system was integrated. Experimental results of the wheat grain appearance quality detection device showed that the proposed imperfect wheat grain identification model and the multiple phenotypic parameter acquisition model achieved high recognition and measurement accuracy. The developed prototype demonstrated stable operation,good cost-effectiveness,and comprehensive detection parameters. The results can provide a reference for rapid breeding of high-quality wheat varieties and trait improvement.