Abstract:In order to further study growth trend and yield changes of winter wheat at different time scales, remotely sensed vegetation temperature condition index (VTCI) and leaf area index (LAI) which are closely related to crop water stress and crop growth were selected as two key variables for indicating crop growth condition and estimating crop yields in the Guanzhong Plain, China. Taking Morlet wavelet as a function, wavelet transform and cross wavelet transform were used to analyze the main oscillation period and resonance cycle between VTCI, LAI and time series yield at different time scales. The weights of VTCI and LAI at each growth stage were determined by calculating the wavelet cross-correlation degree, which were used to construct the single-parameter and double-parameter yield estimation models, respectively. The results showed that VTCI, LAI and yield had different main oscillation periods and resonance cycles. The normalized root mean square errors (NRMSE) of the weighted VTCI and weighted LAI yield estimation models constructed by the wavelet transform were 16.88% and 13.58%, respectively, the values of the coefficient of determination (R2) were 0.259 and 0.520, respectively, and the NRMSE and R2 of the double-parameter estimation model were 13.52% and 0.531, respectively. These results indicated that the yield estimation model based on double-parameters had higher accuracy. For the cross wavelet transform, NRMSEs based on weighted VTCI and weighted LAI yield estimation model were 16.83% and 13.56%, R2 were 0.263 and 0.522, respectively. NRMSE based on double-parameter estimation model was 13.40% and R2 was 0.533. Therefore, it can be concluded that the estimation models based on the cross wavelet transform had higher accuracy than those based on the wavelet transform. The double-parameter yield estimation model constructed by resonance cycles was used to estimate the yields in the Guanzhong Plain from 2011 to 2018, and the results showed that the yield was high in the west and low in the east.